UniSiC successfully delivered the KGD (Known Good Die) Test System overseas in 2025. This accomplishment marks a new phase in UniSiC’s global strategy, further strengthening the competitiveness of China’s power semiconductor testing solutions in the global market.

2025年，忱芯科技KGD（Known Good Die）测试系统成功交付海外客户。此次设备的顺利落地，标志着忱芯科技全球化战略迈入新阶段，进一步巩固了中国功率半导体测试设备在全球市场的竞争力。

As a technology-driven company specializing in power semiconductor test equipment, UniSiC remains committed to customer-centric innovation, dedicating itself to the independent R&D and breakthroughs in testing technologies for next-generation power devices such as SiC and GaN. From initial R&D investment to the stable operation of its KGD systems in multiple leading customers’ production lines, reflecting UniSiC’s profound expertise in power semiconductor testing. Now, the KGD test system expands into overseas markets, embarking on a worldwide journey of 'Intelligent Manufacturing from China'.

作为专注功率半导体测试设备的技术企业，忱芯科技始终坚持以客户需求为导向，深耕SiC、GaN等新一代功率器件测试技术的自主研发与创新突破。从最初的研发投入，到产品在多家头部客户产线稳定运行，KGD机台一路走来，凝聚了忱芯科技在功率半导体测试领域的深厚积累。如今，它即将“出海”，踏上属于“中国智造”的全球之旅。

Technical Strength, International Recognition Earned

技术实力  赢得国际认可

This overseas-delivered KGD test system integrates critical mass-production technologies, having earned international customer recognition through demonstrated technical capabilities:

此次出口的KGD测试平台，集成了多项面向量产级场景的关键技术，凭实力赢得了国际客户的认可：

KGD Test System for SiC MOSFET

● Extremely low stray inductance to enable high quality KGD AC (Short-circuit) Test

● Ultra-fast protection to minimize socket and pin damages

● State of the Art in-situ probe tip cleaning to assure high yield test

● Adopting a high-speed, scalable handler solution to achieve utmost UPH (2800)

● 极低杂散电感，确保高质量的KGD动态（短路）测试

● 超快速保护，最大限度减少socket和pin的损坏

● 先进的在线原位探针清洁技术，确保高良率测试

● 采用高速运动、可拓展的Handler解决方案，以实现极高的UPH（2800）

Built in China, Bound for the World

从“芯”出发，驶向世界

This overseas-delivered KGD system demonstrates UniSiC's technical capabilities and marks a significant milestone in our global expansion strategy. We are committed to strengthening our worldwide service capabilities to provide best-in-class power semiconductor testing solutions, partnering with global customers to co-create a sustainable future in the new energy era.

此次设备出海，不仅是对忱芯科技产品性能与交付能力的高度认可，更是公司加速“走出去”的重要一步。未来，忱芯将持续拓展全球服务网络，提供更具竞争力的功率半导体测试解决方案，与全球客户携手共创新能源时代的美好未来。扬帆出海，风正劲；踔厉奋发，启新程。忱芯科技，正在将“中国智造”推向更广阔的世界舞台。

About UniSiC

We are innovation leader in high precision measurement instruments and ATE system solutions for power semiconductor devices. Our products cover all test of Sic, GaN and Si power semiconductor devices, providing accurate, reliable, and cost-effective test system solutions for IDM enterprises. NEV manufacturers, Tierls, and power device design and packaging enterprises.

Our test systems include dynamic wafer-level reliability test system, known good die test system, surge current test system, dynamic characteristics test system, static characteristics test system, dynamic reliability test system, automotive-grade continuous power test system, etc. We cover power semiconductor test from wafer level test (chip probing), chip level test (known good die), discrete/module level test (final test), and system level test, which can meet various scenario requirements in laboratories and production lines.

关于忱芯科技UniSiC

忱芯科技(UniSiC)是功率半导体自动化测试系统解决方案创新领导者，产品可覆盖SiC、GaN以及Si基功率半导体器件各测试环节，为功率半导体IDM企业、新能源车厂及Tier1、功率器件设计与封装企业提供精准、可靠、高性价比的测试解决方案。

忱芯科技的SiC功率半导体测试系统产品包括：晶圆级动态WLR测试系统、芯片级KGD测试系统、高温正偏测试系统、动态测试系统、静态测试系统、动态可靠性测试系统、连续功率测试系统等，全面覆盖功率半导体晶圆级测试、芯片级测试、单管/模块级测试和系统级测试，可满足实验室与生产线的多种场景需求。